IDDT testing originating in the nineties can check integrated circuit fault which can not be checked through the voltage testing and IDDQtesting. IDDT testing needs to generate two or more vectors at a time. The testing generation algorithm is complex. So finding an efficient algorithm has important signification for improving the testing. This paper proposes a new algorithm for transient current test generation based on ant route in simulation test, and finds one of the best ways of checking integrated circuit fault using the feature of self-accomodation and positive feedback in ant algorithm. The algorithm is very simple and easy to realize. SPICE simulation tests show that the test result is efficient.
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曾晓杰 邝继顺. 基于蚂蚁路径的IDDT测试生成[J]. 科学技术与工程, 2007, (17): 4364-4368. ZENG Xiao-jie, KUANG Ji-shun. IDDT Test Generation Based on Ant Algorithm[J]. Science Technology and Engineering,2007,(17):4364-4368.