The in-circuit functional test is the most essential and important function of PCB examination system. Aiming at the functional test result may be not right because of the influence of in-circuit factor,and the functional test can’t process because of the new spare part continuously appears,put forward a comprehensive technical solution to take in-circuit function test as a predominance, assisted to test technique and intelligence VI curve scanning technique, can quickly carry out circuit board breakdown examination and fixed position.
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郑伟正. 基于隔离技术的器件在线功能测试方法研究[J]. 科学技术与工程, 2010, (21): . zhengweizheng. Research on In-circuit Function Test Technique of PCB Based on Guarding Technique[J]. Science Technology and Engineering,2010,(21).